The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Apr. 24, 2019
HI Llc, Los Angeles, CA (US);
Roarke Horstmeyer, Durham, NC (US);
Haojiang Zhou, Los Angeles, CA (US);
Haowen Ruan, Los Angeles, CA (US);
Yuecheng Shen, Guangzhou University City, CN;
Jamu Alford, Simi Valley, CA (US);
HI LLC, Los Angeles, CA (US);
Abstract
A non-invasive optical measurement system comprises a two-dimensional array of photonic integrated circuits (PICs) mechanically coupled to each other. Each PIC is configured for emitting sample light into an anatomical structure, such that the sample light is scattered by the anatomical structure, resulting in physiological-encoded signal light that exits the anatomical structure. Each PIC is further configured for detecting the signal light. The non-invasive optical measurement system further comprises processing circuitry configured for analyzing the detected signal light from each of the PICs, and based on this analysis, determining an occurrence and a three-dimensional spatial location of the physiological event in the anatomical structure.