The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jun. 03, 2021
Applicant:

Rigaku Corporation, Tokyo, JP;

Inventors:

Masashi Kageyama, Tokyo, JP;

Kenichi Okajima, Tokyo, JP;

Kouichi Katou, Tokyo, JP;

Assignee:

Rigaku Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01);
Abstract

An X-ray image generation device includes a moving mechanism that moves an object relative to a grating part in a direction crossing X-rays emitted toward the grating part. The grating part includes N (2≤N) regions along the direction of movement by the moving mechanism. A cyclic direction of a grating structure in each of the plurality of gratings belonging to an ith (1≤i≤N−1) region out of the N regions and a cyclic direction of a grating structure in each of the plurality of gratings belonging to an (i+1)th region out of the N regions are different directions. The plurality of gratings are configured so that moiré interference fringes generated in the N regions have a cyclic intensity fluctuation measurable by the detector and of at least one cycle or more in the direction of movement by the moving mechanism.


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