The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2022
Filed:
Jul. 19, 2019
Olympus Corporation, Tokyo, JP;
Atsuyoshi Shimamoto, Tokyo, JP;
Keiichiro Nakajima, Tokyo, JP;
Masashi Yamada, Tokyo, JP;
Takamitsu Sakamoto, Tokyo, JP;
Mitsuru Namiki, Saitama, JP;
Mikihiko Terashima, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An optical-scanning-type observation probe is provided with: an imaging optical system that illumination light scanned by an optical scanner enters and that focuses the illumination light in the form of a spot, multiple times; a projection optical system that emits illumination light coming from a focus position focused by the imaging optical system, toward a subject in the form of a spot; and a light-receiver that is provided independently of the imaging optical system and the projection optical system and that receives reflected light of the illumination light, the reflected light coming from the subject, via a light path different from that of the imaging optical system and the projection optical system.