The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2022
Filed:
Jun. 08, 2021
Changxin Memory Technologies, Inc., Hefei, CN;
Tianchen Lu, Hefei, CN;
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Abstract
Disclosed are a test method for self-refresh frequency of a memory array and a memory array test device. The test method includes: providing a memory array; determining a shortest duration for charge in memory cells of the memory array to leak off, and marking the shortest duration as a first duration; setting an auto-refresh cycle of the memory array according to the first duration, where the auto-refresh cycle is longer than the first duration; performing m tests, where an ntest includes sequentially performing the following: refresh position count resetting, writing preset data to the memory array, performing a self-refresh having a duration of T, performing an auto-refresh having a duration of one auto-refresh cycle, reading the memory array, and recording a read status, where T<T, and 2≤n≤m.
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