The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Jul. 31, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Christian Lavoie, Pleasantville, NY (US);

Markus Brink, White Plains, NY (US);

Benjamin Wymore, Cortlandt Manor, NY (US);

Jeng-Bang Yau, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/04 (2006.01); G06N 10/00 (2022.01); H01L 39/08 (2006.01);
U.S. Cl.
CPC ...
G01N 27/041 (2013.01); G06N 10/00 (2019.01); H01L 39/08 (2013.01);
Abstract

A method of measuring contact resistance at an interface for superconducting circuits is provided. The method includes using a chain structure of superconductors to measure a contact resistance at a contact between contacting superconductor. The method further includes eliminating ohmic resistance from wire lengths in the chain structure by operating below the lowest superconducting transition temperature of all the superconductors in the chain structure. The measurement is dominated by contact resistances of the contacts between contacting superconductors in the chain.


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