The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Jul. 13, 2018
Applicant:

Jenoptik Optical Systems Gmbh, Jena, DE;

Inventors:

Tobias Gnausch, Jena, DE;

Robert Buettner, Jena, DE;

Thomas Kaden, Dresden, DE;

Thomas Juhasz, Weimar, DE;

Armin Grundmann, Jena, DE;

Thilo Von Freyhold, Weimar, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G01R 31/311 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01M 11/30 (2013.01); G01R 31/311 (2013.01); G01R 31/2889 (2013.01); G01R 31/2891 (2013.01);
Abstract

The invention relates to a contacting module () by means of which the individual electrical and optical inputs and outputs (A) of optoelectronic chips () are connected to the device-specific electrical and optical inputs and outputs of a test apparatus. It is characterized by a comparatively high adjustment insensitivity of the optical contacts between the chips () and the contacting module (), which is achieved, for example, by technical measures which result in the optical inputs (E) of the chip () or on the contacting module () being irradiated in every possible adjustment position by the optical signal (S) to be coupled in.


Find Patent Forward Citations

Loading…