The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Jan. 31, 2020
Applicant:

Apex Semiconductor;

Inventors:

Alfred Yeung, San Jose, CA (US);

Minkyu Kim, San Jose, CA (US);

Suresh Subramaniam, San Jose, CA (US);

Pravin Chingudi, Karnataka, IN;

Assignee:

Apex Semiconductor, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3315 (2020.01); G06F 30/3308 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3315 (2020.01); G06F 30/3308 (2020.01); G06F 2119/12 (2020.01);
Abstract

Techniques improve integrated circuit design by employing multi-operating condition frequency prediction for statically timed designs through statistical analysis. A design management component (DMC) can determine a trained model representing timing path properties and operating conditions of agnostic timing paths based on an analysis of vectorized data that represents timing path information associated with the agnostic timing paths. DMC can perform statistical regression on the vectorized data to facilitate training the trained model. A static timing analysis (STA) component can perform STA on design information associated with the integrated circuitry design and determine an operating condition of a timing path of the integrated circuitry design based on the STA. DMC can predict or determine at least one other operating condition associated with the integrated circuitry design based on the operating condition and the trained model.


Find Patent Forward Citations

Yeung, Alfred. (2022). Multi-pvt frequency prediction (multi-pvt fp) for statically timed designs through statistical regression (U.S. Patent No. 11475194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11475194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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