The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Apr. 28, 2020
Capital One Services, Llc, McLean, VA (US);
Koon Heng Ivan Teo, San Francisco, CA (US);
Qingyi Sui, Falls Church, VA (US);
Mohammad Shami, Foster City, CA (US);
Yoonseong Kim, Berkley, CA (US);
Fernando San Martin Jorquera, Los Altos, CA (US);
Francisco Perez Leon, Richmond, CA (US);
Capital One Services, LLC, McLean, VA (US);
Abstract
Disclosed are systems and methods for monitoring user-defined metrics. A method may include: receiving, from a user device, a metric definition usable to generate queries to obtain data for a metric to be monitored; receiving, from the user device, a monitoring configuration indicative of a manner in which a metric monitoring process associated with the metric definition is to be repeatedly performed; storing the metric definition in a metric definition database; and repeatedly performing the metric monitoring process in accordance with the monitoring configuration. The metric monitoring process may include: retrieving the metric definition from the metric definition database; generating a database query based on the metric definition, the database query including one or more executable database statements defined by the metric definition; executing the database query to obtain query result data, the query result data being data for the metric; and storing the query result data.