The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Feb. 22, 2021
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Yudhishthir Prasad Kandel, Durham, NC (US);

Lawrence S. Melvin, III, Hillsboro, OR (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06F 30/398 (2020.01); G03F 7/20 (2006.01); G06F 111/08 (2020.01); G06F 111/10 (2020.01); G06F 119/18 (2020.01); G06F 119/22 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G03F 7/705 (2013.01); G03F 7/70625 (2013.01); G06F 2111/08 (2020.01); G06F 2111/10 (2020.01); G06F 2119/18 (2020.01); G06F 2119/22 (2020.01);
Abstract

A method, includes, in part, defining a continuous signal, defining a threshold value, calibrating the continuous signal and the threshold value from measurements made on edges of one or more patterns on a mask and corresponding edges of the patterns on a wafer, convolving the continuous signal with a kernel to form a corrected signal, and establishing, by a processor, a probability of forming an edge at a point along the corrected signal in accordance with a difference between the value of the corrected signal at the point and the calibrated threshold value. The kernel is calibrated using the same measurements made on the patterns' edges.


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