The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Mar. 06, 2020
Applicant:

Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;

Inventors:

Jae Hyuk Choi, Seoul, KR;

Dong Uk Kim, Suwon-si, KR;

Jung Hoon Chun, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/4863 (2020.01); G01S 7/48 (2006.01); G01S 17/10 (2020.01); G01S 7/4865 (2020.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4863 (2013.01); G01S 7/4808 (2013.01); G01S 7/4865 (2013.01); G01S 17/10 (2013.01); G01S 17/894 (2020.01);
Abstract

Provided is an apparatus for measuring a depth with a pseudo 4-tap pixel structure, the apparatus including a delta sigma circuit configured to calculate, through a delta sigma operation, a delta value of a first angle corresponding to a first row line of a pixel array for measuring a depth of an object and calculate, through a delta sigma operation, a delta value of a third angle corresponding to a second row line of the pixel array, a memory configured to store the calculated delta value of the first angle corresponding to the first row line, and an arithmetic logic unit (ALU) configured to compute depth information corresponding to the first row line by using the stored delta value of the first angle corresponding to the first row line and the calculated delta value of the third angle corresponding to the second row line.


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