Jung Hoon Chun

Title: Innovations of Jung Hoon Chun

Introduction

Jung Hoon Chun is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of imaging technology, particularly in the development of advanced sensor systems. With a total of 2 patents, his work reflects a commitment to innovation and efficiency in technology.

Latest Patents

One of his latest patents is an "Apparatus for measuring depth with pseudo 4-tap pixel structure." This invention includes a delta sigma circuit designed to calculate depth information by processing pixel data from a pixel array. The apparatus effectively measures the depth of an object by utilizing a unique approach to angle calculations.

Another significant patent is related to "CMOS image sensor systems using low-power multi-mode data path and methods of processing the same." This invention focuses on reducing power consumption in CMOS Image Sensor (CIS) systems by optimizing data transmission based on pixel color and bit significance. The system is capable of operating in multiple modes, enhancing both efficiency and performance.

Career Highlights

Jung Hoon Chun is affiliated with Sungkyunkwan University, where he contributes to research and development in imaging technologies. His academic background and professional experience have positioned him as a key figure in his field.

Collaborations

He has collaborated with Jae Hyuk Choi, further enhancing the scope and impact of his innovations. Their partnership exemplifies the collaborative spirit often found in research and development.

Conclusion

Jung Hoon Chun's contributions to imaging technology through his patents demonstrate his innovative spirit and dedication to advancing the field. His work continues to influence the development of efficient sensor systems, making a lasting impact on technology.