The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Sep. 17, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Mayfor Dangkiw, Kanagawa, JP;

Takasumi Ikebe, Kanagawa, JP;

Hirofumi Kanno, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/30 (2015.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04B 17/30 (2015.01); H04L 25/03828 (2013.01);
Abstract

A signal analysis apparatus includes a first frequency conversion unitthat generates an intermediate frequency signal Sand a second spurious signal Sfrom a measured signal Sof a frequency f(center frequency f), and a second frequency conversion unitthat converts the intermediate frequency signal Sand the second spurious signal Sinto an intermediate frequency signal S' of a frequency f′ and a second spurious signal S′ of a frequency f′ by performing frequency shift of the intermediate frequency signal Sand the second spurious signal Sby a frequency shift amount Δf, in which the frequency shift amount Δf is a value that does not establish a relationship of −W/2≤f′−f′≤+W/2.


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