The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Dec. 22, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Daiki Kano, Kanagawa, JP;

Takumi Nakamura, Kanagawa, JP;

Daisuke Nakagawa, Kanagawa, JP;

Masato Takeuchi, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/29 (2015.01);
Abstract

Provided are a mobile terminal test apparatus, a mobile terminal test system, and a control method for the mobile terminal test apparatus, which can reduce burdens on a user for setting parameters according to a specification of a test. A setting screen is displayed with a first operation imagefor selecting a specification of a test and a second operation imagein which parameter operation imagestofor setting parameters for executing the test according to the specification selected by an operation with respect to the first operation imageare arranged based on parameter hierarchies. With an operation of changing one parameter with respect to the parameter operation imagesto, lower parameter operation images whose parameter hierarchies are lower than the parameter operation image are updated according to the specification selected by the operation with respect to the first operation image


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