The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Mar. 26, 2021
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Guangteng Long, Hefei, CN;

Hao He, Hefei, CN;

Dan Lu, Hefei, CN;

Bo Hu, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/10 (2006.01); G11C 29/12 (2006.01); G11C 29/36 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G11C 29/12015 (2013.01); G11C 29/36 (2013.01); G11C 29/46 (2013.01); G11C 2029/3602 (2013.01);
Abstract

The present disclosure provides a memory test method, a storage medium and a computer device. The memory test method comprises: obtaining a target test pattern that needs to be written into a plurality of chip interfaces, the plurality of chip interfaces being connected to a plurality of physical interfaces in a one-to-one correspondence; determining second information of the chip interfaces corresponding to first information of the physical interfaces, and using the first information and the second information as corresponding connection information; remapping the corresponding connection information to obtain mapped connection information; and determining, according to the target test pattern and the mapped connection information, an initial test pattern that needs to be written into the physical interfaces.


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