The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Oct. 18, 2017
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Aniruddha Sinha, Kolkata, IN;

Debatri Chatterjee, Kolkata, IN;

Kingshuk Chakravarty, Kolkata, IN;

Rahul Dasharath Gavas, Kolkata, IN;

Pratyusha Das, Kolkata, IN;

Uttama Lahiri, Gandhinagar, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09B 19/00 (2006.01); G09B 7/00 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G09B 19/00 (2013.01); G06N 7/005 (2013.01); G09B 7/00 (2013.01);
Abstract

System and method for digitized digit symbol substitution test (DSST) are disclosed. In an example, a display area of a digitized DSST device is partitioned into multiple bins. Further, a series of number symbol pairs is displayed as a lookup table on top of the display, termed as a lookup area. Furthermore, a question and answer (QA) pair corresponding to the series of number symbol pairs to an examinee in multiple trials. In addition, feature values for the QA pair are computed in each of the multiple bins in the trials, wherein the feature values comprise a response time and an accuracy of response by the examinee. Moreover, probabilities of the feature values are determined in each of the multiple bins. Also, an entropy value based on the probabilities of the feature values is computed in each of the multiple bins providing information on distribution.


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