The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Sep. 28, 2020
Mpi Corporation, Chu-Pei, TW;
Yang-Hung Cheng, Chu-Pei, TW;
Ya-Hung Lo, Chu-Pei, TW;
Chien-Hsun Chen, Chu-Pei, TW;
Chia-Nan Chou, Chu-Pei, TW;
Chung-Yen Huang, Chu-Pei, TW;
Shou-Jen Tsai, Chu-Pei, TW;
Fuh-Chyun Tang, Chu-Pei, TW;
MPI CORPORATION, Chu-Pei, TW;
Abstract
An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.