The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Apr. 07, 2020
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Haowen Ruan, Los Angeles, CA (US);

Hooman Mohseni, Santa Monica, CA (US);

Assignee:

HI LLC, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2021.01); G01B 9/02091 (2022.01); G01N 21/47 (2006.01); A61B 5/00 (2006.01); G01B 9/02015 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); A61B 5/0073 (2013.01); G01B 9/02028 (2013.01); G01N 21/4795 (2013.01);
Abstract

Source light having a range of optical wavelengths is generated. The source light is split into sample light and reference light. The sample light is delivered into a sample, such that the sample light is scattered by the sample, resulting in signal light that exits the sample. The signal light and the reference light are combined into an interference light pattern having optical modes, each having a direct current (DC) component and at least one alternating current (AC) component. Different subsets of the optical modes of the interference light pattern are respectively detected, and analog signals representative of the optical modes of the interference light pattern are output. Pair of the analog signals are subtracted from each other, and differential analog signals are output. The sample is analyzed based on the differential analog signals.


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