The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Apr. 16, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jalal Mahmud, San Jose, CA (US);

Amita Misra, San Jose, CA (US);

Pritam Gundecha, San Jose, CA (US);

Zhe Liu, San Jose, CA (US);

Rama Kalyani T. Akkiraju, San Jose, CA (US);

Xiaotong Liu, San Jose, CA (US);

Anbang Xu, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A method, system, and a computer program product automatically select training data for updating a model by applying human-annotated training data to a model to generate results that are evaluated to identify correct case results and false case results that are categorized into error type categories for use in building error models corresponding to the error type categories, where each error model is built from at least failed case results belonging to a corresponding error type, and where unlabeled data samples are applied to each error model to compute an error likelihood for each unlabeled data sample with respect to each error type category, thereby enabling the selection and display of unlabeled data samples for annotation by a subject matter expert based on a computed error likelihood for the one or more unlabeled data samples in a specified error type category meeting or exceeding an error threshold requirement.


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