The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Sep. 10, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventor:

Seiji Takahashi, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H01L 27/14605 (2013.01); H01L 27/1463 (2013.01); H01L 27/14612 (2013.01); H01L 27/14636 (2013.01); H01L 27/14643 (2013.01); H01L 27/14689 (2013.01); H01L 27/1464 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01); H01L 27/14685 (2013.01); H04N 5/378 (2013.01);
Abstract

Various embodiments of the present disclosure are directed towards an image sensor including a first photodetector and a second photodetector each disposed within a semiconductor substrate. An isolation structure extends from a front-side surface of the semiconductor substrate to a back-side surface of the semiconductor substrate. The front-side surface is opposite the back-side surface and the isolation structure is laterally between the first and second photodetectors. A readout transistor is disposed on the front-side surface of the semiconductor substrate. A first side of the readout transistor overlies the first photodetector and a second side of the readout transistor overlies the second photodetector. The first side is opposite the second side and the readout transistor continuously extends over the isolation structure.


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