The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Jul. 19, 2021
Sift Science, Inc., San Francisco, CA (US);
Wei Liu, San Francisco, CA (US);
Kevin Lee, San Francisco, CA (US);
Hui Wang, San Francisco, CA (US);
Rishabh Kothari, San Francisco, CA (US);
Helen Marushchenko, San Francisco, CA (US);
Sift Science, Inc., San Francisco, CA (US);
Abstract
Systems and methods for detecting digital abuse or digital fraud that involves malicious account testing includes implementing a machine learning threat model that predicts malicious account testing using misappropriate accounts, wherein a subset of a plurality of learnable variables of an algorithmic structure of the machine learning threat model includes one or more learnable variables derived based on feature data indicative of malicious account testing; wherein implementing the machine learning threat model includes: (i) identifying event data from an online event that is suspected to involve digital fraud or digital abuse, (ii) extracting adverse feature data from the event data that map to the one or more learnable variables of the subset, and (iii) providing the adverse feature data as model input to the machine learning threat model; and computing, using the machine learning threat model, a threat prediction indicating a probability that the online event involves malicious account testing.