The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Mar. 12, 2020
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Ruel Jucoy Mijares, Cabuyao, PH;

Viren Khandekar, Flower Mound, TX (US);

Edson Macgregor Arca Leano, Mulawin Tanza, PH;

Hilario Sanchez Jacala, Paranaque, PH;

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01); G01R 31/307 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/307 (2013.01); G01R 1/0491 (2013.01);
Abstract

A system for monitoring and controlling an IC testing machine includes a vibration sensor, a sensor interface, and a processor coupled to the sensor interface. The vibration sensor is in mechanical communication with an IC testing machine to develop an electrical vibration signal representing mechanical vibrations generated by the operation of the IC testing machine. The sensor interface processes the vibration signal to develop vibration data that can be processed by the processor to determine whether the vibration data is indicative of an operational anomaly and, if so, to generate a machine control signal to correct an operation of the IC testing machine. Multiple vibration sensors can be used to increase the amount of vibration data available for analysis.


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