The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Oct. 21, 2020
Applicant:

Epistar Corporation, Hsinchu, TW;

Inventors:

Tzu-Chieh Hu, Hsinchu, TW;

Wei-Chieh Lien, Hsinchu, TW;

Chen Ou, Hsinchu, TW;

Chia-Ming Liu, Hsinchu, TW;

Tzu-Yi Chi, Hsinchu, TW;

Assignee:

EPISTAR CORPORATION, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); H01L 33/14 (2010.01); H01L 33/12 (2010.01); H01L 33/32 (2010.01); H01S 5/00 (2006.01); H01L 33/02 (2010.01); H01L 33/38 (2010.01); H01L 33/42 (2010.01);
U.S. Cl.
CPC ...
H01L 33/0025 (2013.01); H01L 33/025 (2013.01); H01L 33/12 (2013.01); H01L 33/14 (2013.01); H01L 33/325 (2013.01); H01S 5/00 (2013.01); H01L 33/007 (2013.01); H01L 33/38 (2013.01); H01L 33/42 (2013.01);
Abstract

A semiconductor device includes: a first semiconductor region; and a first electrode on the first semiconductor region; wherein first semiconductor region includes a first layer and a second layer, the second layer includes a first portion and a second portion adjacent to the first portion, the first portion has a first thickness, the second portion has a second thickness less than the first thickness, the first layer includes a first material and a first dopant, the first material includes multiple elements, the first dopant has a first concentration, the second layer includes a second material and a second dopant, the second material includes multiple elements, the second dopant has a second concentration, one of the elements of the first material of the first layer is different from the elements of the second material of the second layer.


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