The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Sep. 25, 2020
Applicant:

Sang-yun Lee, Hillsboro, OR (US);

Inventor:

Sang-Yun Lee, Hillsboro, OR (US);

Assignee:

BeSang Inc., Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/10885 (2013.01); H01L 27/10814 (2013.01); H01L 27/10855 (2013.01); H01L 27/10873 (2013.01); H01L 27/10897 (2013.01); H01L 29/66666 (2013.01); H01L 29/7827 (2013.01);
Abstract

The invention involves a method of manufacturing a bonded semiconductor structure, comprising providing a support substrate which carries a transistor, and providing an interconnect region earned by the support substrate. The interconnect region includes a first multiple bypass bitline having an upper bypass interconnect and upper bypass via. The method includes providing a first conductive bonding layer carried by the interconnect region, wherein the first conductive bonding layer is connected to the upper bypass interconnect through the upper bypass via, and providing a vertical transistor carried by the first conductive bonding layer, the vertical transistor being in communication with the transistor through the interconnect region. The first multiple bypass bitline reduces the impedance experienced by the vertical transistor.


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