The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jun. 01, 2021
Tokyo Electron Limited, Tokyo, JP;
Tokyo Electron Limited, Tokyo, JP;
Abstract
A method of characterizing an imaging device includes calibrating the imaging device by collecting readings for regular pixels and at least one sealed pixel of the imaging device over one or more periods of time for a sequence of integration time (T) and a plurality of number of lines (NOL) when no light enters the imaging device, obtaining a dark level (DL) by averaging the readings for the regular pixels over the respective period of time and the number of the regular pixels, and obtaining P by averaging the readings of the at least one sealed pixel over the respective period of time and the number of the at least one sealed pixel. A relation between DL and P is determined for each T and NOL using an equation: DL=A*P+Offset. A current value of DL is determined by using a current value of P and the equation.