The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Dec. 27, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seunghoon Ko, Suwon-si, KR;

Hoondo Heo, Suwon-si, KR;

Dongchul Kim, Suwon-si, KR;

Jooyoung Park, Suwon-si, KR;

Eunsung Cho, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0447 (2019.05); G06F 3/0412 (2013.01); G06F 3/0443 (2019.05); G06F 3/04166 (2019.05);
Abstract

An electronic device according is provided. The electronic device includes a touch sensor, a touch sensor integrated circuit (IC) configured to identify an input position on the touch sensor, a display, and a display driving IC configured to provide, to the display, at least one driving signal for driving the display, wherein the touch sensor IC is configured to measure, based on a first schedule, the input position on the touch sensor while a first driving signal among the at least one driving signal is provided from the display driving IC in a first interval, the first schedule being configured such that the at least one driving signal does not overlap a time period of the measurement of the input position, detect, based on a change of an interval of the first driving signal from the first interval to a second interval, an event in which a time period of the first driving signal being provided at least partially overlaps the time period of the measurement of the input position, and measure the input position, based on a second schedule which is different from the first schedule.


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