The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Aug. 23, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Tiemo Anhut, Jena, DE;
Matthias Wald, Jena, DE;
Daniel Schwedt, Jena, DE;
Beate Böhme, Großpürschütz, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The assembly an optical scanning unit as a first focusing device for providing a first pupil plane, a first beam deflecting device, which is made of a first scanner arranged in the first pupil plane, for scanning the excitation radiation and/or manipulation radiation in a first coordinate direction, and a second focusing device for generating a second pupil plane, which is optically conjugated to the first pupil plane. A second beam deflecting device is provided for deflecting the excitation radiation and/or manipulation radiation, said second deflecting device being arranged in the second pupil plane. A third focusing device is provided in order to generate a third pupil plane, optically conjugated to the first pupil plane. A third beam deflecting device is arranged in the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, and a variable beam deflecting means is provided in order to switch an optical beam path between a first beam path and a second beam path.