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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11416655 B1

PDFFull Text
Date of Patent:
Aug. 16, 2022

Filed:

Mar. 09, 2018

Analysis mesh generation method, recording medium, and analysis mesh generation device

Applicant:

Toray Engineering Co., Ltd., Tokyo, JP;

Inventor:

Mitsuaki Kato, Kyoto, JP;

Assignee:

TORAY ENGINEERING CO., LTD., Tokyo, JP;

Attorney:

Global IP Counselors, LLP

Primary Examiner:

Bijan Mapar

Int. Cl.
CPC ...
G06F 30/20 (2020.01); B33Y 50/00 (2015.01); G06T 19/20 (2011.01); G06F 30/23 (2020.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); B33Y 50/00 (2014.12); G06T 19/20 (2013.01); G06F 30/23 (2020.01); G06F 2111/10 (2020.01); G06T 2219/2008 (2013.01);
Abstract

An analysis mesh generation method is used for a modeling simulation of an article modeled according to a tool path. The method comprises: inputting the tool path for a product to be analyzed; defining an initial mesh that is made up of a number of microelements and encompasses the tool path; and determining overlap between the tool path and the microelements, removing non-overlapping microelements from the initial mesh, and storing an association of the tool path with overlapping microelements.

Find Patent Forward Citations

Kato, Mitsuaki. (2022). Analysis mesh generation method, recording medium, and analysis mesh generation device (U.S. Patent No. 11416655). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11416655

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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