The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Jul. 02, 2020
Applicant:

The Nielsen Company (Us), Llc, New York, NY (US);

Inventors:

Michael Sheppard, Holland, MI (US);

Jonathan L. Sullivan, Hurricane, UT (US);

Jake Ryan Dailey, San Francisco, CA (US);

Damien Forthomme, Seattle, WA (US);

Jessica D. Brinson, Chicago, IL (US);

Molly Poppie, Arlington Heights, IL (US);

Christie Nicole Summers, Baltimore, MD (US);

Diane Morovati Lopez, West Hills, CA (US);

Assignee:

The Nielsen Company (us), LLC, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2255 (2019.01);
Abstract

Methods and apparatus to estimate audience sizes using deduplication based on binomial sketch data are disclosed. An apparatus to estimate an audience size for media based on binomial sketch data includes a coefficient analyzer to determine coefficient values of a polynomial based on variances, a covariance, and cardinalities corresponding to first binomial sketch data from a first database and second binomial sketch data from a second database. The apparatus also includes an overlap analyzer to determine a real root of the polynomial. The real root corresponds to an estimate of an overlap between the first binomial sketch data and the second binomial sketch data. The apparatus further includes a report generator to estimate the audience size based on the estimate of the overlap and the cardinalities of the first and second binomial sketch data.


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