The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Dec. 28, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Nilesh Jain, Portland, OR (US);

Vui Seng Chua, Penang, MY;

Fahim Mohammad, Hillsboro, OR (US);

Anindya Paul, Hillsboro, OR (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/14 (2022.01); G06N 20/00 (2019.01); G06N 7/00 (2006.01); H04L 43/022 (2022.01); H04L 43/16 (2022.01); H04L 41/16 (2022.01); H04L 67/12 (2022.01); H04W 4/38 (2018.01); H04W 4/70 (2018.01);
U.S. Cl.
CPC ...
H04L 41/145 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); H04L 41/16 (2013.01); H04L 43/022 (2013.01); H04L 43/16 (2013.01); H04L 67/12 (2013.01); H04W 4/38 (2018.02); H04W 4/70 (2018.02);
Abstract

Example systems, methods, and apparatus to generate optimized models for Internet of Things device are disclosed. An example apparatus includes a data receiver to collect data from a sensor of an internet of things device based a first sampling frequency and a buffer having a first buffer size; a model trainer to train a model based on the data collected from the sensor; a buffer analyzer to select a second sampling frequency and to reduce the buffer to a second buffer size, the model trainer to update the model based on the second buffer size; and a platform analyzer to: determine a duration of time that that internet of things device will take to analyze sensor data based on the updated model.


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