The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Dec. 19, 2019
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

P E Ramesh, Bengaluru, IN;

Tsuyoshi Miyazaki, Kawaguchi, JP;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/14 (2006.01); G01R 19/25 (2006.01); H01P 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); H01P 3/003 (2013.01); H04L 5/1423 (2013.01);
Abstract

A test and measurement instrument for extracting waveforms from a differential transmission line without disrupting the differential transmission line. The test and measurement instrument includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the first and second lines of the differential transmission line that electrically connect a first device and a second device, a second input configured to receive a current waveform from a current probe coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first device and a voltage of the second device based on the voltage waveform and the current waveform.


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