The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Dec. 06, 2019
Rigaku Corporation, Akishima, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Takao Moriyama, Takatsuki, JP;
RIGAKU CORPORATION, Akishima, JP;
Abstract
An X-ray fluorescence spectrometer of the present invention includes a counting time calculation unit () configured to: by a predetermined quantitative calculation method, determine each of quantitative values by using reference intensities of one standard sample and repeatedly perform a procedure of determining each of the quantitative values in a case where only a measured intensity of one of measurement lines is changed by a predetermined value, to calculate a ratio of a change in each of the quantitative values to the predetermined value as a quantitative-value-to-intensity change ratio, the one of the measurement lines having the measured intensity to be changed being different on each repetition of the procedure; and use quantitative-value-to-intensity change ratios calculated thereby for all the measurement lines to calculate a counting time for each of the measurement lines from a quantification precision specified for each of the quantitative values.