The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Nov. 20, 2019
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Masaaki Ubukata, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); H01J 49/02 (2006.01); H01J 49/04 (2006.01); G01N 30/02 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7206 (2013.01); H01J 49/022 (2013.01); H01J 49/0422 (2013.01); G01N 2030/025 (2013.01); H01J 49/0009 (2013.01);
Abstract
Mass spectrometry for a specimen is repeatedly performed while stepwise changing a parameter (for example, a current value) of an emitter current. Based on a plurality of chromatograms generated by this process, an evaluation value table including a plurality of evaluation values is generated. An individual evaluation value shows a degree of tailing for individual peak included in each chromatogram. A parameter function is generated based on the evaluation value table. The parameter of the emitter current is controlled according to the parameter function.