The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Apr. 16, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Wen Xiao, Singapore, SG;

Vibhu Jindal, San Jose, CA (US);

Sanjay Bhat, Bangalore, IN;

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01); C23C 14/50 (2006.01); H01J 37/34 (2006.01); C23C 14/14 (2006.01); G03F 1/24 (2012.01);
U.S. Cl.
CPC ...
C23C 14/505 (2013.01); C23C 14/14 (2013.01); C23C 14/3407 (2013.01); C23C 14/3464 (2013.01); H01J 37/3417 (2013.01); G03F 1/24 (2013.01); H01J 2237/20214 (2013.01); H01J 2237/3323 (2013.01);
Abstract

A physical vapor deposition chamber comprising a rotating substrate support having a rotational axis, a first cathode having a radial center positioned off-center from a rotational axis of the substrate support is disclosed. A process controller comprising one or more process configurations selected from one or more of a first configuration to determine a rotation speed (v) for a substrate support to complete a whole number of rotations (n) around the rotational axis of the substrate support in a process window time (t) to form a layer of a first material on a substrate, or a second configuration to rotate the substrate support at the rotation speed (v).


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