The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Feb. 24, 2020
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Nian Yang, Mountain View, CA (US);

Piyush Dhotre, San Jose, CA (US);

Sahil Sharma, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01); G06F 9/48 (2006.01); G06F 11/14 (2006.01); G06F 1/20 (2006.01); G06F 12/0882 (2016.01);
U.S. Cl.
CPC ...
G06F 11/3058 (2013.01); G06F 1/206 (2013.01); G06F 9/4881 (2013.01); G06F 11/076 (2013.01); G06F 11/106 (2013.01); G06F 11/1072 (2013.01); G06F 11/142 (2013.01); G06F 11/3037 (2013.01); G06F 12/0882 (2013.01);
Abstract

A method and apparatus for dynamically determining when, or how often, to do a read scan operation on a solid-state storage drive. One solution adjusts a read scan interval as part of performing a read scan operation. First, a bit error rate is determined for one of a plurality of storage blocks of a non-volatile memory array. Then, a cross temperature metric for the storage block is determined. A read scan interval is changed in response to the cross temperature metric satisfying a cross temperature threshold. Then, data in the storage block is relocated to a free storage block in response to the bit error rate satisfying a relocation threshold.


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