The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Jan. 19, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Daniel Stegmann, Grossschwabhausen, DE;
Daniel Harangozo, Gauting, DE;
Peter Schacht, Erfurt, DE;
Thomas Milde, Nausnitz, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens (), in particular on a displacement path of an optical zoom lens () of a microscope. The optical zoom lens () is arranged in a beam path () between an object () to be recorded and an electronic image sensor (). In a first method step, an optical marker is introduced into the beam path () at a position of the beam path () located between the object () to be recorded and the optical zoom lens (), such that the optical marker passes the optical zoom lens () and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens (). The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor () and to an electronic image recording device.