The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Dec. 16, 2020
Changxin Memory Technologies, Inc., Anhui, CN;
Chia-Chi Hsu, Hefei, CN;
Changxin Memory Technologies, Inc., Hefei, CN;
Abstract
A chip test device and a chip test method are provided. The chip test device may include a chip socket and an interface card comprising a signal synthesizer, a plurality of first interfaces and a second interface. The signal synthesizer may be configured to synthesize a plurality of low-frequency first signals output from a plurality of testers into a high-frequency second signal and transmit the second signal to the chip socket. The plurality of first interfaces may be arranged in a plurality of inputs of the signal synthesizer for connecting the testers, and the second interface may be arranged in an output of the signal synthesizer for connecting the chip socket. By synthesizing the low-frequency first signals into the high-frequency second signal, a high-frequency test may be conducted using a plurality of low-frequency testers.