The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Mar. 24, 2020
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Kun Liu, Portland, OR (US);
Steven J. Randolph, Portland, OR (US);
Assignee:
FEI Company, Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/075 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/075 (2013.01); H01J 37/28 (2013.01);
Abstract
A charged particle beam source, such as for use in an electron microscope, can include an electrically conductive support member coupled to a base, a mounting member coupled to the support member and defining a bore, and an emitter member received in the bore and retained by a fixative material layer flowed around the emitter member in the bore.
Quick Actions:
Liu, Kun. (2022). Charged particle beam source (U.S. Patent No. 11380511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11380511
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile