The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Oct. 06, 2020
Cadence Design Systems, Inc., San Jose, CA (US);
Rajesh Khurana, Noida, IN;
Divyank Mittal, Uttar Pradesh, IN;
Sagar Kumar, Uttarakhand, IN;
Vivek Chickermane, Slaterville Springs, NY (US);
CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);
Abstract
An IC chip test engine selects an instrument of an IC design based on an instrument access script, wherein the selected instrument comprises an IP block and a test data register (TDR) logically arranged upstream from the IP block. The IC chip test engine can also identify a set of SIBs gating access to the selected instrument and select a scan chain for operating the set of SIBs to control access to the selected instrument. The IC chip test engine augments the scan chain with data to cause at least a furthest downstream SIB of the set of SIBs that gates access to the selected instrument to transition to an opened state. The IC chip test engine can generate a set of load vectors for the scan chain to load the TDR of the selected instrument with data to apply a respective test pattern to the IP block.