The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Dec. 08, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven Michael Douskey, Rochester, MN (US);

Orazio Pasquale Forlenza, Hopewell Junction, NY (US);

Mary P. Kusko, Hopewell Junction, NY (US);

Franco Motika, Hopewell Junction, NY (US);

Gerard Michael Salem, Willsboro, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3187 (2006.01); G11C 29/16 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/3183 (2013.01); G01R 31/3187 (2013.01); G01R 31/318538 (2013.01); G01R 31/318566 (2013.01); G11C 29/16 (2013.01);
Abstract

A method includes executing a test against a first structure and a second structure of a built-in self-test circuit. Each of the first and second structures include a plurality of latches arranged as a plurality of stump chains. The method also includes unloading a first result of the test from the plurality of stump chains of the first structure and a second result of the test from the plurality of stump chains of the second structure. The method further includes determining that the plurality of stump chains of the first structure includes a faulty latch based on the first result not matching the second result.


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