The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Apr. 26, 2018
Hewlett-packard Development Company, L.p., Spring, TX (US);
Sunil Kothari, Palo Alto, CA (US);
Jun Zeng, Palo Alto, CA (US);
Gary J. Dispoto, Palo Alto, CA (US);
Viseth Sean, Orange, CA (US);
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
A system and method for providing three dimensional printing production quality prediction is described herein. The system may include logic to scan a region of interest associated with a layer of a plurality of parts during printing to obtain an input for the region of interest and compute an input metric associated with the layer based on the input. In response to an initial set of print jobs, at least a portion of the plurality of parts is mechanically tested to determine at least one output. In response to a production print job, a likelihood of a part of the plurality of parts to satisfy a quality specification is predicted by inputting the input metric to at least one machine learning function comprising the at least one output, wherein the at least one machine learning function is trained during the initial set of print jobs.