The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Sep. 25, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for optically examining a plurality of microscopic samples. The samples are channeled one after the other by means of a flow into at least one flow channel in which the samples advance along a flow direction. The samples are illuminated, and light emitted from the samples is detected and analyzed. A device for carrying out the method in which samples are illuminated in that at least one light sheet with a light sheet plane is directed onto the at least one flow channel, wherein the light sheet is oriented so as to intersect the at least one flow channel in an intersection region, and the normal of the light sheet plane forms an angle differing from null together with the flow direction in the intersection region. The light emitted from the sample is registered by an imaging optical detection unit, and the focal plane of said optical detection unit lies in the intersection region.