The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

May. 22, 2020
Applicant:

Nippon Yttrium Co., Ltd., Omuta, JP;

Inventors:

Ryuichi Sato, Omuta, JP;

Naoki Fukagawa, Omuta, JP;

Yuji Shigeyoshi, Omuta, JP;

Kento Matsukura, Omuta, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 4/11 (2016.01); C23C 4/10 (2016.01); C23C 4/04 (2006.01); C23C 14/06 (2006.01); C23C 14/34 (2006.01); C04B 35/50 (2006.01); C04B 35/515 (2006.01); C04B 35/553 (2006.01); C23C 14/26 (2006.01); C23C 14/35 (2006.01); C23C 24/08 (2006.01); C04B 111/00 (2006.01);
U.S. Cl.
CPC ...
C23C 4/10 (2013.01); C04B 35/50 (2013.01); C04B 35/5156 (2013.01); C04B 35/553 (2013.01); C23C 4/04 (2013.01); C23C 4/11 (2016.01); C23C 14/06 (2013.01); C23C 14/0694 (2013.01); C23C 14/26 (2013.01); C23C 14/3414 (2013.01); C23C 14/35 (2013.01); C23C 24/082 (2013.01); C04B 2111/00482 (2013.01); C04B 2235/3224 (2013.01); Y10T 428/29 (2015.01);
Abstract

The present invention relates a coating powder comprising a rare earth oxyfluoride (Ln-O—F) and having: an average particle size (D) of 0.1 to 10 μm, a pore volume of pores having a diameter of 10 μm or smaller of 0.1 to 0.5 cm/g as measured by mercury intrusion porosimetry, and a ratio of the maximum peak intensity (S0) assigned to a rare earth oxide (LnO) in the 2θ angle range of from 20° to 40° to the maximum peak intensity (S1) assigned to the rare earth oxyfluoride (Ln-O—F) in the same range, S0/S1, of 1.0 or smaller in powder X-ray diffractometry using Cu-Kα rays or Cu-Kαrays.


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