The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Nov. 30, 2020
Applicant:

Shanghai Huali Integrated Circuit Corporation, Shanghai, CN;

Inventor:

Wenyin Weng, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 21/8234 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0924 (2013.01); H01L 21/823431 (2013.01); H01L 29/66795 (2013.01); H01L 29/7851 (2013.01);
Abstract

A method for manufacturing a fin field-effect transistor is provided, comprising making metal gates, a gate dielectric layer, and a work function layer of the metal gate structures, followed by removing a portion of the end of each of the metal gates that protrudes from a fin region. Since the work function layer is already formed by the removing step, the process window of the work function layer is not affected. Therefore, a relatively large edge region of the metal gates can be removed, thereby minimizing the parasitic capacitance Cgs between the gate and the source or parasitic capacitance Cgd between the gate and the drain of a fin field-effect transistor device in operation. Meanwhile this step simplifies and compatible with the finFET process.


Find Patent Forward Citations

Loading…