The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2022

Filed:

Oct. 01, 2019
Applicant:

Carl Zeiss Sms Ltd., D.N. Misgav, IL;

Inventors:

Vladimir Dmitriev, Tsurit, IL;

Kujan Gorhad, Kfar Kama, IL;

Joachim Welte, Darmstadt, DE;

Tanya Serzhanyuk, Rishon LeZion, IL;

Assignee:

Carl Zeiss SMS Ltd., D.N. Misgav, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 1/72 (2012.01); G03F 1/74 (2012.01); G03F 1/86 (2012.01); G03F 1/60 (2012.01);
U.S. Cl.
CPC ...
G03F 1/74 (2013.01); G03F 1/60 (2013.01); G03F 1/72 (2013.01); G03F 1/86 (2013.01); G03F 7/70441 (2013.01); G03F 7/70466 (2013.01); G03F 7/70508 (2013.01); G03F 7/70625 (2013.01);
Abstract

The present invention refers to a method and an apparatus for determining positions of a plurality of pixels to be introduced into a substrate of a photolithographic mask by use of a laser system, wherein the pixels serve to at least partly correct one or more errors of the photolithographic mask. The method comprises the steps: (a) obtaining error data associated with the one or more errors; (b) obtaining first parameters of an illumination system, the first parameters determining an illumination of the photolithographic mask of the illumination system when processing a wafer by illuminating with the illumination system using the photolithographic mask; and (c) determining the positions of the plurality of pixels based on the error data and the first parameters.


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