The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Jun. 07, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Federico Pio, Brugherio, IT;

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); G06F 11/07 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 3/067 (2013.01); G06F 3/0617 (2013.01); G06F 3/0644 (2013.01); G06F 11/073 (2013.01);
Abstract

A method for managing memory element failures in a memory subsystem is described. The method includes detecting, by the memory subsystem, a failed memory element in the memory subsystem and transmitting a redundant memory request based on detection of the failed memory element. The redundant memory request seeks to utilize memory storage in an external storage system in place of the failed memory element in the memory subsystem. Thereafter, the memory subsystem receives, from the external storage system, a redundant memory request confirmation, which indicates that the redundant memory request has been fulfilled and includes an address of a location in the external storage system. In response to receipt of the redundant memory request confirmation, the memory subsystem updates memory management information to map a logical address, which was previously mapped to the failed memory element, to the location in the external storage system.


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