The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Jul. 01, 2016
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Markus Dominik Mueck, Unterhaching, DE;
Christian Drewes, Germering, DE;
Eryk Dutkiewicz, Sydney, AU;
Gengfa Fang, Sydney, AU;
Sabine Roessel, Munich, DE;
Keith Nolan, Mullingar, IE;
Pierce Rixon, Sydney, AU;
Srikathyayani Srikanteswara, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04W 4/00 (2018.01); H04L 41/0659 (2022.01); H04L 43/50 (2022.01); H04W 12/06 (2021.01); H04W 84/00 (2009.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
H04W 4/00 (2013.01); H04L 41/0659 (2013.01); H04L 43/50 (2013.01); H04W 12/06 (2013.01); H04W 84/005 (2013.01); H04W 84/18 (2013.01);
Abstract
A method and apparatus for managing node failures in a mesh network is provided. In an example method for, a trigger is sent to a target node to return test data. The test data received from the target node is analyzed. The target node is classified as valid if the test data is within expected parameters.