The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jun. 24, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Hideyuki Endo, Kanagawa, JP;

Hironori Watanabe, Kanagawa, JP;

Takumi Nakamura, Kanagawa, JP;

Yui Yoshida, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
H04B 17/3912 (2015.01);
Abstract

A measuring deviceperforms control to perform a reception sensitivity test of measuring a throughput of a signal under measurement, and repeating the measurement while changing an output level of a test signal at each measurement position corresponding to a plurality of orientations. The integrated control devicethat performs the control includes a measurement situation display control unitthat displays a measurement progress display screen having a first display area for displaying a result of the reception sensitivity test up to the measurement position where the reception sensitivity test is completed, and a second display area for displaying a progress situation of the measurement of the reception sensitivity test at the measurement position at which the reception sensitivity test is started.


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