The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2022
Filed:
Nov. 03, 2017
Applicant:
Washington University, St. Louis, MO (US);
Inventors:
Laurence David Sibley, St. Louis, MO (US);
Kevin M. Brown, St. Louis, MO (US);
Qiuling Wang, St. Louis, MO (US);
Iti Saraav, St. Louis, MO (US);
Assignee:
Washington University, St. Louis, MO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/00 (2006.01); A61K 39/00 (2006.01); A61M 5/315 (2006.01); A61K 39/002 (2006.01);
U.S. Cl.
CPC ...
A61K 39/0002 (2013.01); A61K 39/002 (2013.01); A61M 5/31531 (2013.01); A61K 2039/54 (2013.01); A61K 2039/572 (2013.01); A61K 2039/6087 (2013.01);
Abstract
Antigens ofthat provide specific and strong delayed type hypersensitivity (DTH) immune response, or which stimulate IFN-y secretion, are used for testing subjects for infection. Any skin testing format may be adapted for testing for the delayed type hypersensitivity, including a patch, a needle, or a prong. Presence of DTH indicates infection. Alternate methods of detecting a T cell response including monitoring IFN-y secretion may be used.