The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

May. 05, 2021
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventor:

Takuma Hasegawa, Kawasaki, JP;

Assignee:

OMNIVISION TECHNOLOGIES, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/361 (2011.01); H04N 5/351 (2011.01); H04N 5/3745 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/361 (2013.01); H04N 5/351 (2013.01); H04N 5/378 (2013.01); H04N 5/37452 (2013.01);
Abstract

Image sensors having reduced dark current and white pixel are disclosed herein. In one embodiment, each pixel of the image sensor includes a photodiode (PD), a first floating diffusion (FD) coupled to the photodiode through a transfer (TX) transistor, a second floating diffusion (FD) coupled to the FDthrough a dual floating diffusion (DFD) transistor, and a lateral overflow integrating capacitor (LOFIC) coupled between the FDand a variable reference voltage (VCAP). A method for a correlated double sampling (CDS) readout includes: exposing a photodiode (PD) to light during an exposure period and increasing a capacitance of the LOFIC by setting the VCAP to a high voltage (H) level during an integration period of the exposure period.


Find Patent Forward Citations

Hasegawa, Takuma. (2022). Dark current/white pixel devices and methods for lateral overflow image sensors (U.S. Patent No. 11343450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11343450

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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