The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Oct. 05, 2020
Applicants:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Universite Grenoble Alpes, Saint Martin d'Heres, FR;

Inventors:

Mickaël Martin, Grenoble, FR;

Thierry Baron, Saint-Egreve, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 29/46 (2006.01); H01L 21/02 (2006.01); C23C 16/02 (2006.01); C23C 16/30 (2006.01); C30B 25/18 (2006.01); C30B 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02568 (2013.01); C23C 16/0272 (2013.01); C23C 16/305 (2013.01); C30B 25/183 (2013.01); C30B 29/06 (2013.01); C30B 29/46 (2013.01); H01L 21/0243 (2013.01); H01L 21/0262 (2013.01); H01L 21/02381 (2013.01); H01L 21/02433 (2013.01); H01L 21/02485 (2013.01); H01L 21/02598 (2013.01);
Abstract

A process for epitaxying GaSe on a [111]-oriented silicon substrate, includes a step of selecting a [111]-oriented silicon substrate resulting from cutting a silicon bar in a miscut direction which is one of the three [11-2] crystallographic directions, the miscut angle (α) being smaller than or equal to 0.1°, the obtained surface of the substrate forming a vicinal surface exhibiting a plurality of terraces and at least one step between two terraces; a passivation step consisting of depositing an atomic bilayer of gallium and of selenium on the vicinal surface of the silicon substrate so as to form a passivated vicinal surface made of silicon-gallium-selenium (Si—Ga—Se), said passivated vicinal surface exhibiting a plurality of passivated terraces and at least one passivated step between two passivated terraces; a step of forming a layer of two-dimensional GaSe by epitaxy on the passivated surface, said formation step comprising a step of nucleation from each passivated step and a step of lateral growth on the passivated terraces from the nuclei obtained in the nucleation step. A structure obtained by means of the epitaxying process is also provided.


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